A Fast Hill Climbing Algorithm for Defect and Variation...

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A Fast Hill Climbing Algorithm for Defect and Variation Tolerant Logic Mapping of Nano-Crossbar Arrays

Peker, Furkan, Altun, Mustafa
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Year:
2018
Language:
english
Journal:
IEEE Transactions on Multi-Scale Computing Systems
DOI:
10.1109/TMSCS.2018.2829518
File:
PDF, 2.23 MB
english, 2018
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