Embedded AlN/GaN multi-layer for enhanced crystal quality...

Materials Science in Semiconductor Processing 2018 / 11 Vol. 86

Embedded AlN/GaN multi-layer for enhanced crystal quality and surface morphology of semi-polar (11-22) GaN on m-plane sapphire

Omar, Al-Zuhairi, Shuhaimi, Ahmad, Makinudin, Abdullah Haaziq Ahmad, Abdul Khudus, Muhammad I.M., Supangat, Azzuliani
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
86
Language:
english
Journal:
Materials Science in Semiconductor Processing
DOI:
10.1016/j.mssp.2018.06.014
Date:
November, 2018
File:
PDF, 2.03 MB
english, 2018
Conversion to is in progress
Conversion to is failed