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[IEEE 2018 IEEE International Conference on Microelectronic Test Structures (ICMTS) - Austin, TX, USA (2018.3.19-2018.3.22)] 2018 IEEE International Conference on Microelectronic Test Structures (ICMTS) - Measurement time reduction technique for input referred noise of dynamic comparator
Ishijima, Yuki, Nakagawa, Shuya, Ishikuro, HirokiYear:
2018
Language:
english
DOI:
10.1109/ICMTS.2018.8383799
File:
PDF, 2.10 MB
english, 2018