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Low-Power Built-In Self-Test Techniques for Embedded SRAMs
Lu, Shyue-Kung, Hsiao, Yuang-Cheng, Liu, Chia-Hsiu, Yang, Chun-LinVolume:
2007
Year:
2007
Language:
english
Journal:
VLSI Design
DOI:
10.1155/2007/67019
File:
PDF, 1.48 MB
english, 2007