Correct determination of lifetime for minority carriers in high-resistivity silicon—minimal thickness needed
Chaput, P., Blanc, D., Casanovas, E., Peyre-Lavigne, A., Chapuis, Anne-Marie, Soudain, G.Volume:
2
Year:
1966
Language:
english
Journal:
Electronics Letters
DOI:
10.1049/el:19660189
File:
PDF, 285 KB
english, 1966