Correct determination of lifetime for minority carriers in...

Correct determination of lifetime for minority carriers in high-resistivity silicon—minimal thickness needed

Chaput, P., Blanc, D., Casanovas, E., Peyre-Lavigne, A., Chapuis, Anne-Marie, Soudain, G.
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Volume:
2
Year:
1966
Language:
english
Journal:
Electronics Letters
DOI:
10.1049/el:19660189
File:
PDF, 285 KB
english, 1966
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