SamEn-SVR: using sample entropy and support vector regression for bug number prediction
Zhang, Wen, Du, Yuhang, Yoshida, Taketoshi, Wang, Qing, Li, XiangjunVolume:
12
Language:
english
Journal:
IET Software
DOI:
10.1049/iet-sen.2017.0168
Date:
June, 2018
File:
PDF, 1.95 MB
english, 2018