[IEEE 2018 China Semiconductor Technology International Conference (CSTIC) - Shanghai (2018.3.11-2018.3.12)] 2018 China Semiconductor Technology International Conference (CSTIC) - Investigation on the leakage of triple split-gate flash device and its improve solution
Cao, Zigui, Zhang, Lingyue, Sun, Yan, Su, BuchunYear:
2018
DOI:
10.1109/CSTIC.2018.8369241
File:
PDF, 770 KB
2018