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[IEEE 2018 IEEE International Conference on Microelectronic Test Structures (ICMTS) - Austin, TX, USA (2018.3.19-2018.3.22)] 2018 IEEE International Conference on Microelectronic Test Structures (ICMTS) - Test structures for seed layer optimisation of electroplated ferromagnetic films

Dover, C. M. Mackenzie, Ross, A. W. S., Smith, S., Terry, J. G., Mount, A. R., Walton, A. J.
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Year:
2018
Language:
english
DOI:
10.1109/ICMTS.2018.8383766
File:
PDF, 558 KB
english, 2018
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