[IEEE 2018 IEEE International Memory Workshop (IMW) - Kyoto, Japan (2018.5.13-2018.5.16)] 2018 IEEE International Memory Workshop (IMW) - Understanding Endurance in TiN/a-Si/TiOx/TiN RRAM Devices
Subhechha, Subhali, Degraeve, Robin, Belmonte, Attilio, Goux, Ludovic, Luca Donadio, Gabriele, Roussel, Philippe, De Meyer, Kristin, Van Houdt, Jan, Kar, Gouri SankarYear:
2018
Language:
english
DOI:
10.1109/IMW.2018.8388856
File:
PDF, 2.27 MB
english, 2018