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Experimental evaluation of mutual coupling influence on the isolation characteristics of a dual-port v-type line impedance stabilization network
Ibuchi, Takaaki, Mori, Shunji, Funaki, TsuyoshiVolume:
7
Language:
english
Journal:
IEEE Electromagnetic Compatibility Magazine
DOI:
10.1109/MEMC.0.8339540
Date:
September, 2018
File:
PDF, 3.53 MB
english, 2018