Influence of Latch-Up Immunity Structure on ESD Robustness...

IEEE Transactions on Device and Materials Reliability 2018 / 6 Vol. 18; Iss. 2

Influence of Latch-Up Immunity Structure on ESD Robustness of SOI-LIGBT Used As Output Device

Ye, Ran, Liu, Siyang, Tian, Ye, Xue, Ying, Sun, Weifeng, Su, Wei, Lin, Feng, Sun, Guipeng, Ma, Shulang, Liu, Yuwei
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Volume:
18
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/TDMR.2018.2829550
Date:
June, 2018
File:
PDF, 2.01 MB
english, 2018
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