[IEEE 2001 IEEE MTT-S International Microwave Symposium...

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[IEEE 2001 IEEE MTT-S International Microwave Symposium Digest - Phoenix, AZ, USA (20-25 May 2001)] 2001 IEEE MTT-S International Microwave Sympsoium Digest (Cat. No.01CH37157) - Pulse characterization of trapping and thermal effects of microwave GaN power FETs

Augaudy, S., Quere, R., Teyssier, J.P., Di Forte-Poisson, M.A., Cassette, S., Dessertenne, B., Delage, S.L.
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Volume:
1
Year:
2001
Language:
english
DOI:
10.1109/mwsym.2001.966922
File:
PDF, 328 KB
english, 2001
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