Study of Thick Film Resistors By 1/f Noise Measurements

Active and Passive Electronic Components 1989 Vol. 13; Iss. 3

Study of Thick Film Resistors By 1/f Noise Measurements

Ambrózy, A., Hahn, E., Kiss, L. B., Trefán, G.
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Volume:
13
Year:
1989
Language:
english
Journal:
Active and Passive Electronic Components
DOI:
10.1155/1989/36201
File:
PDF, 1.47 MB
english, 1989
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