Degradation of Junction Parameters of an Electrically Stressed NPN Bipolar Transistor
Toufik, N., Pélanchon, F., Mialhe, P.Volume:
24
Year:
2001
Language:
english
Journal:
Active and Passive Electronic Components
DOI:
10.1155/2001/53209
File:
PDF, 1.75 MB
english, 2001