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Raman Spectra of High- κ Dielectric Layers Investigated with Micro-Raman Spectroscopy Comparison with Silicon Dioxide
Borowicz, P., Taube, A., Rzodkiewicz, W., Latek, M., Gierałtowska, S.Volume:
2013
Year:
2013
Language:
english
Journal:
The Scientific World Journal
DOI:
10.1155/2013/208081
File:
PDF, 1.68 MB
english, 2013