Improving Breakdown Voltage for a Novel SOI LDMOS with a Lateral Variable Doping Profile on the Top Interface of the Buried Oxide Layer
Jin, Jingjing, Hu, Shengdong, Chen, Yinhui, Tan, Kaizhou, Luo, Jun, Zhou, Feng, Chen, Zongze, Huang, YeVolume:
2015
Year:
2015
Language:
english
Journal:
Advances in Condensed Matter Physics
DOI:
10.1155/2015/762498
File:
PDF, 2.38 MB
english, 2015