Failure Mechanisms That Cause High Electrical Leakage in Multilayer Ceramic Capacitors
Ikeo, Hirofumi, Sakamoto, Sanpei, Sato, Ken, Nishiura, Hisakazu, Ohno, KatsuhiroVolume:
8
Year:
1981
Language:
english
Journal:
ElectroComponent Science and Technology
DOI:
10.1155/apec.8.175
File:
PDF, 2.39 MB
english, 1981