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Journal of Electronic Testing 2018 / 6

Fault Tolerance Mechanisms for FPGA-Based Regular Expression Matching

Leipnitz, Marcos T., Nazar, Gabriel L.
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Language:
english
Journal:
Journal of Electronic Testing
DOI:
10.1007/s10836-018-5736-7
Date:
June, 2018
File:
PDF, 1.13 MB
english, 2018
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