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Theoretical Framework of Statistical Noise in Scanning Transmission Electron Microscopy
Seki, Takehito, Ikuhara, Yuichi, Shibata, NaoyaLanguage:
english
Journal:
Ultramicroscopy
DOI:
10.1016/j.ultramic.2018.06.014
Date:
June, 2018
File:
PDF, 1.42 MB
english, 2018