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Noncontact AFM and differential reflectance spectroscopy joint analyses of bis-pyrenyl thin films on bulk insulators: Relationship between structural and optical properties
Bocquet, Franck, Nony, Laurent, Para, Franck, Luangprasert, Philipda, Naubron, Jean-Valère, Loppacher, Christian, Leoni, Thomas, Thomas, Anthony, Ranguis, Alain, d'Aléo, Anthony, Fages, Frédéric, BeckVolume:
97
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.97.235434
Date:
June, 2018
File:
PDF, 6.59 MB
english, 2018