[IEEE 2018 China Semiconductor Technology International Conference (CSTIC) - Shanghai (2018.3.11-2018.3.12)] 2018 China Semiconductor Technology International Conference (CSTIC) - Electrical and thermal characterization of SiC power MOSFET
Sato, Takashi, Oishi, Kazuki, Hiromoto, Masayuki, Shintani, MichihiroYear:
2018
Language:
english
DOI:
10.1109/CSTIC.2018.8369327
File:
PDF, 854 KB
english, 2018