[IEEE 2018 IEEE International Reliability Physics Symposium (IRPS) - Burlingame, CA (2018.3.11-2018.3.15)] 2018 IEEE International Reliability Physics Symposium (IRPS) - Estimating transistor channel temperature using time-resolved and time-integrated NIR emission
Stellari, Franco, Weger, Alan J., Jenkins, Keith A., Rosa, Giuseppe La, Linder, Barry, Song, PeilinYear:
2018
Language:
english
DOI:
10.1109/IRPS.2018.8353625
File:
PDF, 963 KB
english, 2018