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Structural defects in ZnGeP 2 single crystals revealed by X-ray topography
Lei, Zuotao, Kolesnikov, Aleksei, Vasilenko, Anton, Zhu, Chongqiang, Verozubova, Galina, Yang, ChunhuiVolume:
51
Language:
english
Journal:
Journal of Applied Crystallography
DOI:
10.1107/S1600576718006726
Date:
August, 2018
File:
PDF, 3.92 MB
english, 2018