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Quantitative SIMS Analysis of Trace Metallic Impurities in High Purity Copper
Takeshita, Hiroyuki T., Kagawa, Takuya, Suzuki, Ryosuke O., Oishi, Toshio, Ono, KatsutoshiVolume:
60
Year:
1996
DOI:
10.2320/jinstmet1952.60.3_290
File:
PDF, 576 KB
1996