Determining EDS and EELS partial cross-sections from...

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Micron 2018 / 6

Determining EDS and EELS partial cross-sections from multiple calibration standards to accurately quantify bi-metallic nanoparticles using STEM

Varambhia, Aakash, Jones, Lewys, London, Andrew, Ozkaya, Dogan, Nellist, Peter D., Lozano-Perez, Sergio
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Language:
english
Journal:
Micron
DOI:
10.1016/j.micron.2018.06.015
Date:
June, 2018
File:
PDF, 1.29 MB
english, 2018
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