[IEEE 2018 13th IEEE Conference on Industrial Electronics...

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[IEEE 2018 13th IEEE Conference on Industrial Electronics and Applications (ICIEA) - Wuhan, China (2018.5.31-2018.6.2)] 2018 13th IEEE Conference on Industrial Electronics and Applications (ICIEA) - Research on edge defects image recognition technology based on artificial neural network

Chen, Naijian, Men, Xiuhua, Hua, Cheng, Wang, Xu, Han, Xiangdong, Chen, Hui
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Year:
2018
Language:
english
DOI:
10.1109/ICIEA.2018.8398024
File:
PDF, 1.16 MB
english, 2018
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