Characterization and Optimization of Inverted-T FinFET Under Nanoscale Dimensions
Yu, Eunseon, Heo, Keun, Cho, SeongjaeYear:
2018
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2018.2846478
File:
PDF, 2.29 MB
english, 2018