Two-dimensional Gaussian fitting for precise measurement of...

Microscopy 2018 / 03 Vol. 67; Iss. suppl_1

Two-dimensional Gaussian fitting for precise measurement of lattice constant deviation from a selected-area diffraction map

Bekarevich, Raman, Mitsuishi, Kazutaka, Ohnishi, Tsuyoshi, Uesugi, Fumihiko, Takeguchi, Masaki, Inaguma, Yoshiyuki, Ohno, Takahisa, Takada, Kazunori
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Volume:
67
Language:
english
Journal:
Microscopy
DOI:
10.1093/jmicro/dfx121
Date:
March, 2018
File:
PDF, 917 KB
english, 2018
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