Impact of Scaling on CMOS Chip Failure Rate, and Design...

VLSI Design 2001 Vol. 13; Iss. 1-4

Impact of Scaling on CMOS Chip Failure Rate, and Design Rules for Hot Carrier Reliability

Haggag, Amr, McMahon, William, Hess, Karl, Fischer, Björn, Register, Leonard F.
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Volume:
13
Year:
2001
Language:
english
Journal:
VLSI Design
DOI:
10.1155/2001/90787
File:
PDF, 1.73 MB
english, 2001
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