XPS, FTIR, EDX, and XRD Analysis of Al 2...

Journal of Spectroscopy 2015 Vol. 2015

XPS, FTIR, EDX, and XRD Analysis of Al 2 O 3 Scales Grown on PM2000 Alloy

Djebaili, K., Mekhalif, Z., Boumaza, A., Djelloul, A.
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Volume:
2015
Year:
2015
Language:
english
Journal:
Journal of Spectroscopy
DOI:
10.1155/2015/868109
File:
PDF, 5.80 MB
english, 2015
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