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Investigation of single-event transient mitigation via pulse quenching in logic circuits
Luo, Sheng, He, Wei, Zhang, Zhun, He, Lingxiang, Cao, Jianmin, Wu, QingyangVolume:
69
Language:
english
Journal:
IOP Conference Series: Earth and Environmental Science
DOI:
10.1088/1755-1315/69/1/012199
Date:
June, 2017
File:
PDF, 924 KB
english, 2017