X-ray diffraction microscopy based on refractive optics

Journal of Applied Crystallography 2017 / 10 Vol. 50; Iss. 5

X-ray diffraction microscopy based on refractive optics

Poulsen, H. F., Jakobsen, A. C., Simons, H., Ahl, S. R., Cook, P. K., Detlefs, C.
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Volume:
50
Language:
english
Journal:
Journal of Applied Crystallography
DOI:
10.1107/S1600576717011037
Date:
October, 2017
File:
PDF, 1.06 MB
english, 2017
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