Analyzing Electric Field Effect by Applying an Ultra-Short Time Pulse Condition in Hafnium Oxide-Based RRAM
Wu, Cheng-Hsien, Lin, Shih-Kai, Pan, Chih-Hung, Chen, Po-Hsun, Lin, Wen-Yan, Chang, Ting-Chang, Tsai, Tsung-Ming, Xu, You-Lin, Shih, Chih-Cheng, Lin, Yu-Shuo, Chen, Wen-Chung, Wang, Ming-Hui, Zhang, SYear:
2018
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/LED.2018.2849507
File:
PDF, 506 KB
english, 2018