[IEEE 2018 IEEE International Memory Workshop (IMW) - Kyoto, Japan (2018.5.13-2018.5.16)] 2018 IEEE International Memory Workshop (IMW) - Optimizing Programming Energy for Improved RRAM Reliability for High Endurance Applications
Sassine, Gilbert, Alfaro Robayo, Diego, Nail, Cecile, Nodin, Jean-Francois, Coignus, Jean, Molas, Gabriel, Nowak, EtienneYear:
2018
Language:
english
DOI:
10.1109/IMW.2018.8388843
File:
PDF, 2.80 MB
english, 2018