[ASME ASME 2007 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference - Las Vegas, Nevada, USA (September 4–7, 2007)] Volume 4: ASME/IEEE International Conference on Mechatronic and Embedded Systems and Applications and the 19th Reliability, Stress Analysis, and Failure Prevention Conference - Making Design Reviews Count
Beiter, Kurt, Ishii, Kosuke, Karandikar, HarshavardhanYear:
2007
Language:
english
DOI:
10.1115/DETC2007-35848
File:
PDF, 131 KB
english, 2007