Study of Electron Velocity Overshoot in NMOS Inversion...

VLSI Design 1998 Vol. 8; Iss. 1-4

Study of Electron Velocity Overshoot in NMOS Inversion Layers

Shih, Wei-Kai, Jallepalli, Srinivas, Rashed, Mahbub, Maziar, Christine M., Tasch Jr., Al. F.
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Volume:
8
Year:
1998
Language:
english
Journal:
VLSI Design
DOI:
10.1155/1998/65364
File:
PDF, 2.08 MB
english, 1998
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