Probabilistic Modeling of Fatigue Damage Accumulation for Reliability Prediction
Rathod, Vijay, Yadav, Om Prakash, Rathore, Ajay, Jain, RakeshVolume:
2011
Year:
2011
Language:
english
Journal:
International Journal of Quality, Statistics, and Reliability
DOI:
10.1155/2011/718901
File:
PDF, 1.49 MB
english, 2011