Suitability of Various Low-Power Testing Techniques for IP Core-Based SoC: A Survey
Mehta, Usha, Dasgupta, Kankar, Devashrayee, NiranjanVolume:
2011
Year:
2011
Language:
english
Journal:
VLSI Design
DOI:
10.1155/2011/948926
File:
PDF, 1.23 MB
english, 2011