On the Crystallographic Basis of Yield Criteria

On the Crystallographic Basis of Yield Criteria

Hosford, William F.
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Volume:
26
Year:
1996
Language:
english
Journal:
Textures and Microstructures
DOI:
10.1155/tsm.26-27.479
File:
PDF, 1.14 MB
english, 1996
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