[IEEE 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Dresden (2018.3.19-2018.3.23)] 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Concurrent focal-plane generation of compressed samples from time-encoded pixel values
Trevisi, M., Bandala, H. C., Fernandez-Berni, J., Carmona-Galan, R., Rodriguez-Vazquez, A.Year:
2018
Language:
english
DOI:
10.23919/DATE.2018.8342217
File:
PDF, 431 KB
english, 2018