STEM Imaging of Lattice Fringes and beyond in a UHR In-Lens...

STEM Imaging of Lattice Fringes and beyond in a UHR In-Lens Field-Emission SEM

Van Ngo, Vinh, Hernandez, Mike, Roth, Bill, Joy, David C
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Volume:
15
Language:
english
Journal:
Microscopy Today
DOI:
10.1017/S1551929500050951
Date:
March, 2007
File:
PDF, 1.95 MB
english, 2007
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