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New Large Area Silicon Drift Detectors - Fast Analysis without Compromise
Collins, Clair, Rowlands, Neil, Statham, Peter, Holland, JamesVolume:
17
Language:
english
Journal:
Microscopy Today
DOI:
10.1017/S1551929500054936
Date:
January, 2009
File:
PDF, 1.77 MB
english, 2009