Extending Depth of Field in LC-SEM Scenes by Partitioning Sharpness Transforms
Hariharan, H., Koschan, A., Abidi, B., Page, D., Abidi, M., Frafjord, J., Dekanich, S.Volume:
16
Language:
english
Journal:
Microscopy Today
DOI:
10.1017/S1551929500055875
Date:
March, 2008
File:
PDF, 1.34 MB
english, 2008