A Comparison of Grain Size Measurements in Al-Cu Thin Films: Imaging Vs. Diffraction Techniques
Gignac, L.M., Murray, C.E., Rodbell, K.P., Gribelyuk, M.Volume:
10
Language:
english
Journal:
Microscopy Today
DOI:
10.1017/S1551929500058430
Date:
November, 2002
File:
PDF, 9.35 MB
english, 2002