A Comparison of Grain Size Measurements in Al-Cu Thin...

A Comparison of Grain Size Measurements in Al-Cu Thin Films: Imaging Vs. Diffraction Techniques

Gignac, L.M., Murray, C.E., Rodbell, K.P., Gribelyuk, M.
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Volume:
10
Language:
english
Journal:
Microscopy Today
DOI:
10.1017/S1551929500058430
Date:
November, 2002
File:
PDF, 9.35 MB
english, 2002
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