A FIB Micro-Sampling Technique for Three-Dimensional...

Microscopy Today 2004 / 11 Vol. 12; Iss. 6

A FIB Micro-Sampling Technique for Three-Dimensional Characterization of a Site-Specific Defect

Yaguchi, Toshie, Kuroda, Yasushi, Konno, Mitsuru, Kamino, Takeo, Ohnishi, Tsuyohsi, Hashimoto, Takahito, Umemura, Kaoru, Asayama, Kyoichiro
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Volume:
12
Language:
english
Journal:
Microscopy Today
DOI:
10.1017/S1551929500065937
Date:
November, 2004
File:
PDF, 1.27 MB
english, 2004
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