Nondestructive testing method for a new generation of electronics
Azin, Anton, Zhukov, Andrey, Narikovich, Anton, Ponomarev, Sergey, Rikkonen, Sergey, Leitsin, Vladimir, Kopanitsa, N.O., Ovsyannikova, T.Y., Plevkov, V.S., Klopotov, A.A., Teplyakova, L.A., Radchenko,Volume:
143
Year:
2018
Language:
english
Journal:
MATEC Web of Conferences
DOI:
10.1051/matecconf/201814304007
File:
PDF, 702 KB
english, 2018