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Sequential testing for two exponential distributions at arbitrary risks
Michlin, Yefim H., Kaplunov, Vladimir, Ingman, DovVolume:
29
Language:
english
Journal:
International Journal of Quality & Reliability Management
DOI:
10.1108/02656711211224884
Date:
April, 2012
File:
PDF, 297 KB
english, 2012