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[IEEE 2018 IEEE European Test Symposium (ETS) - Bremen, Germany (2018.5.28-2018.6.1)] 2018 IEEE 23rd European Test Symposium (ETS) - Detection of IJTAG attacks using LDPC-based feature reduction and machine learning
Ren, Xuanle, Blanton, R. D. Shawn, Tavares, Vitor GradeYear:
2018
Language:
english
DOI:
10.1109/ETS.2018.8400684
File:
PDF, 254 KB
english, 2018