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[IEEE 2018 IEEE European Test Symposium (ETS) - Bremen, Germany (2018.5.28-2018.6.1)] 2018 IEEE 23rd European Test Symposium (ETS) - Assisted test design for non-intrusive machine learning indirect test of millimeter-wave circuits
Cilici, Florent, Barragan, Manuel J., Mir, Salvador, Lauga-Larroze, Estelle, Bourdel, SylvainYear:
2018
Language:
english
DOI:
10.1109/ETS.2018.8400689
File:
PDF, 622 KB
english, 2018