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[IEEE 2017 IEEE International Conference on Power, Control, Signals and Instrumentation Engineering (ICPCSI) - Chennai, India (2017.9.21-2017.9.22)] 2017 IEEE International Conference on Power, Control, Signals and Instrumentation Engineering (ICPCSI) - Optimized test data generation over suspicious implementation of oracle problem
Mayan, J Albert, Praveena, M D Anto, Rao, Telkar Bharath, Sagar, Uravakonda UdayYear:
2017
Language:
english
DOI:
10.1109/ICPCSI.2017.8392179
File:
PDF, 307 KB
english, 2017